2002-08 Low-Frequency Noise Characterization of Very Large Value Resistors

Submitted by jeremy.cushman on Thu, 04/28/2016 - 16:31
Author: 

C. Arnaboldi, C. Bucci, O. Cremonesi, A. Fascilla, A. Nucciotti, M. Pavan, G. Pessina, S. Pirro, E. Previtali, and M. Sisti

Journal: 
IEEE Transactions on Nuclear Science
Year: 
2002
Volume: 
49
Page: 
1808-1813
DOI: 
10.1109/TNS.2002.801507
Type: 
Other paper
Title: 

Low-Frequency Noise Characterization of Very Large Value Resistors